Scanning Electron Microscopy
“Scanning electron microscopy (SEM) is a game-changing technique for the morphological, texture, failure analysis and microstructural composition analysis and the analysis of contaminants present in samples.”
Scanning Electron Microscopy is a test process that produces a magnified image of a sample using an electron beam for analysis. It is highly effective in micro-analysis and failure mode analysis of materials and composites.
SEM analysis can facilitate the analysis of microscopic and nanoscopic materials and objects with great precision. There are two methods of electron detection when using SEM. Backscattered electrons can help with the analysis of the elemental composition of the sample and the secondary electrons emitted close to the surface can reveal relevant information about the topography and morphology of the sample’s surface. Combined with EDX, it can facilitate better analysis of the chemical and elemental composition of the samples.